Influence of lanthanum addition on microstructure and Properties of Sn-3.5Ag solder system

Hwa Teng Lee, Yin Fa Chen, Ting Fu Hong, Yu Jing Huang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The goal of this research is to evaluate the effects of La addition on the microstructure and microhardness of Sn-Ag based solders. Sn3.5Ag-xLa ternary alloy solder were prepared by adding 0-1.0wt% La into a Sn-3.5Ag alloy. Copper substrates were then dipped into these solders and aged at 150°C for up to 625 hours. The microstructure and microhardness of the as solidified solder and the aged solder/copper couples were investigated. Experimental results show that Sn-3.5Ag-xLa solders are composed of -Sn, Ag3Sn and LaSn3 phases, and their microstructure is refined with La addition. After isothermal aging, Ag3Sn and IMC layer can be effectively depressed by adding a small amount of La element, and the size and amount of LaSn3 compounds did not change perceptibly with storage time. The addition of La increased the microhardness of the Sn-Ag solder due to the refining effect of Ag3Sn particles in eutectic and increased formation of LaSn3 compound. After isothermal storage, the microhardness of solders was decreased with the increasing coarsening of Ag3Sn compounds as aging time was increased. However, coarsening of Ag3Sn compounds was retarded by La addition as revealed in this study. Therefore, La addition helped to improve the microhardness and thermal resistance ofthe solder joints.

Original languageEnglish
Title of host publication2008 10th International Conference on Electronic Materials and Packaging, EMAP 2008
Pages183-186
Number of pages4
DOIs
Publication statusPublished - 2008
Event2008 10th International Conference on Electronic Materials and Packaging, EMAP 2008 - Taipei, Taiwan
Duration: 2008 Oct 222008 Oct 24

Publication series

Name2008 10th International Conference on Electronic Materials and Packaging, EMAP 2008

Other

Other2008 10th International Conference on Electronic Materials and Packaging, EMAP 2008
Country/TerritoryTaiwan
CityTaipei
Period08-10-2208-10-24

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Mechanical Engineering

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