Influences of annealing conditions on flatband voltage properties using continuously workfunction-tuned metal electrodes

K. Ohmori, P. Ahmet, K. Shiraishi, H. Watanabe, Y. Akasaka, K. Yamabe, M. Yoshitake, K. S. Chang, M. L. Green, K. Yamada, T. Chikyow

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication1st IEEE International Workshop on Nano CMOS, IEEE IWNC 2006
Pages160-162
Number of pages3
DOIs
Publication statusPublished - 2006
Event1st IEEE International Workshop on Nano CMOS, IEEE IWNC 2006 - Mishima, Shizuoka, Japan
Duration: 2006 Jan 302006 Feb 1

Publication series

Name2006 International Workshop on Nano CMOS - Proceedings, IWNC

Other

Other1st IEEE International Workshop on Nano CMOS, IEEE IWNC 2006
CountryJapan
CityMishima, Shizuoka
Period06-01-3006-02-01

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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