InGaN/GaN single-quantum-well microdisks

  • Yu Chi Hsu
  • , Ikai Lo
  • , Cheng Hung Shih
  • , Wen Yuan Pang
  • , Chia Hsuan Hu
  • , Ying Chieh Wang
  • , Mitch M.C. Chou

Research output: Contribution to journalArticlepeer-review

15 Citations (Scopus)

Abstract

We have grown In xGa 1-xN/GaN quantum wells atop GaN microdisk with γ-LiAlO 2 substrate by using plasma-assisted molecular beam epitaxy. The structural and optical properties of the samples were analyzed by transmission electron microscopy, x-ray diffraction, cathodoluminescence, and photoluminescence measurements. Based on the measured results, we obtained the indium concentration of the In xGa 1-xN/GaN single quantum well to be x = 0.25 with a band-gap energy of 2.31 eV, which is consistent with the bowing effect of bulk In xGa 1-xN: E g(x) [3.42 - x* 2.65 - x* (1 - x) * 2.4] eV.

Original languageEnglish
Article number242101
JournalApplied Physics Letters
Volume100
Issue number24
DOIs
Publication statusPublished - 2012 Jun 11

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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