Abstract
We have grown In xGa 1-xN/GaN quantum wells atop GaN microdisk with γ-LiAlO 2 substrate by using plasma-assisted molecular beam epitaxy. The structural and optical properties of the samples were analyzed by transmission electron microscopy, x-ray diffraction, cathodoluminescence, and photoluminescence measurements. Based on the measured results, we obtained the indium concentration of the In xGa 1-xN/GaN single quantum well to be x = 0.25 with a band-gap energy of 2.31 eV, which is consistent with the bowing effect of bulk In xGa 1-xN: E g(x) [3.42 - x* 2.65 - x* (1 - x) * 2.4] eV.
| Original language | English |
|---|---|
| Article number | 242101 |
| Journal | Applied Physics Letters |
| Volume | 100 |
| Issue number | 24 |
| DOIs | |
| Publication status | Published - 2012 Jun 11 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)