In0.37Ga0.63N metal-semiconductor-metal photodetectors with recessed electrodes

  • C. L. Yu
  • , C. H. Chen
  • , S. J. Chang
  • , Y. K. Su
  • , S. C. Chen
  • , P. C. Chang
  • , P. C. Chen
  • , M. H. Wu
  • , H. C. Chen
  • , K. C. Su

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)

Abstract

InGaN metal-semiconductor-metal photodetectors (MSM-PDs) with recessed electrodes were fabricated. Compared with the conventional planar MSM-PD, it was found that measured photocurrent and photocurrent-to-dark-current contrast ratio were both much larger for the MSM-PD with the recessed electrodes. With a 5-V applied bias and an incident light wavelength of 470 nm, it was found that measured responsivities were 0.144 and 0.038 A/W for the MSM-PDs with and without the recessed electrodes, respectively.

Original languageEnglish
Pages (from-to)875-877
Number of pages3
JournalIEEE Photonics Technology Letters
Volume17
Issue number4
DOIs
Publication statusPublished - 2005 Apr

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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