A composite layer device incorporating TiO2 and NiCuZn ferrites has been developed. The cofiring behavior and interfacial interaction between TiO2/NiCuZn ferrites at 900 °C were studied by using dilatometry, X-ray diffractometry (XRD), scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS). Intermediate layers were observed following the interfacial reaction between TiO2 and PbO- or Bi2O3-doped NiCuZn ferrites. The intermediate layers were PbTiO3 and Bi4Ti3O12, respectively. But no intermediate layers were produced at the interface between TiO2 and the V2O5-doped NiCuZn ferrites. The intermediate layers formed during cofiring resulted in delamination. Therefore, V2O5 should be recommended as a good sintering aid for NiCuZn ferrite in preparing TiO2/NiCuZn ferrite composite layer devices.
All Science Journal Classification (ASJC) codes
- Ceramics and Composites
- Materials Chemistry