Abstract
Disclosed is an interferometer comprising a light source, a reflective element, and a photodetector. The light source is configured to emit a light beam, and an angle is formed by inclusion between a direction to which the light beam travels and the reflective element, the photodetector is configured to be substantially perpendicular to the reflective element. The light beam is halved into a first light beam propagating by the included angle, and a second light beam reflected off the reflective element, the first light beam and the second light beam interfere each other to form an interferogram on the photodetector, which detects the interferogram.
| Original language | English |
|---|---|
| Patent number | 8830475 |
| Publication status | Published - 1800 |
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Cite this
Su, F., & Chang, C-H. (1800). interferometer and spatial interference fourier transform spectrometer. (Patent No. 8830475).