Internal photoemission in coga/gaas schottky barriers, possible injection of electrons into the l valley

R. Arghavani, R. P.G. Karunasiri, T. C. Kuo, Y. K. Kim, K. L. Wang

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Internal photoemission in epitaxially grown films of CoGa/GaAs Schottky barriers by back illumination is used to study the injection of electrons into L and X valleys of the conduction bands of n-type GaAs. The general theory of Fowler predicts that the photocurrent per absorbed photon should vary as the square of the photon energy hv for [ (hv — Φ6/kT) ] >;O, where Φ6 is the difference between the Fermi level and F point in the GaAs conduction band. Unlike the case for Au/GaAs Schottky barriers, we observe two thresholds in the photocurrent measurements of uniform epitaxial CoGa/GaAs contacts. The second threshold formed at ≈0.3 eV higher than the first threshold (point) is interpreted as the injection of carriers into the L valley of the GaAs from the metal side. A third threshold at ≈0.5 eV above the F point requires a photon energy greater than the energy gap of GaAs (1.4 eV) and hence cannot be observed in the back illumination mode.

Original languageEnglish
Pages (from-to)987-989
Number of pages3
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume9
Issue number3
DOIs
Publication statusPublished - 1991 May

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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