International test conference in Asia (ITC-Asia) - Bridging ITC and test community in Asia

Kuen Jong Lee; Shi Yu Huang; Huawei Li; Tomoo Inoue; Yervant Zorian

doi:10.1109/ITC44170.2019.9000177

International test conference in Asia (ITC-Asia) - Bridging ITC and test community in Asia

Kuen Jong Lee, Shi Yu Huang, Huawei Li, Tomoo Inoue, Yervant Zorian

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

ITC celebrates its 50^th anniversary in 2019. Over its 50 years of history, the testing of an IC has undergone several stages of paradigm shifts. Today, it is still the most vital path leading to IC's quality, reliability, and robustness. Under this flagship conference, the test community has proliferated in almost every region in the world, following the footsteps of the expansion and diversification of our test industry. It is a constant evolution process, and ITC-Asia was born in 2017, to mark another milestone in this globalization process, with an attempt to integrate more people from both academia and industry, especially those in Asia, into a unified worldwide test community.

Original language	English
Title of host publication	2019 IEEE International Test Conference, ITC 2019
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781728148236
DOIs	https://doi.org/10.1109/ITC44170.2019.9000177
Publication status	Published - 2019 Nov
Event	2019 IEEE International Test Conference, ITC 2019 - Washington, United States Duration: 2019 Nov 9 → 2019 Nov 15

Publication series

Name	Proceedings - International Test Conference
Volume	2019-November
ISSN (Print)	1089-3539

Conference

Conference	2019 IEEE International Test Conference, ITC 2019
Country/Territory	United States
City	Washington
Period	19-11-09 → 19-11-15

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Applied Mathematics

Access to Document

10.1109/ITC44170.2019.9000177

Cite this

Lee, K. J., Huang, S. Y., Li, H., Inoue, T., & Zorian, Y. (2019). International test conference in Asia (ITC-Asia) - Bridging ITC and test community in Asia. In 2019 IEEE International Test Conference, ITC 2019 Article 9000177 (Proceedings - International Test Conference; Vol. 2019-November). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ITC44170.2019.9000177

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title = "International test conference in Asia (ITC-Asia) - Bridging ITC and test community in Asia",

abstract = "ITC celebrates its 50th anniversary in 2019. Over its 50 years of history, the testing of an IC has undergone several stages of paradigm shifts. Today, it is still the most vital path leading to IC's quality, reliability, and robustness. Under this flagship conference, the test community has proliferated in almost every region in the world, following the footsteps of the expansion and diversification of our test industry. It is a constant evolution process, and ITC-Asia was born in 2017, to mark another milestone in this globalization process, with an attempt to integrate more people from both academia and industry, especially those in Asia, into a unified worldwide test community.",

author = "Lee, {Kuen Jong} and Huang, {Shi Yu} and Huawei Li and Tomoo Inoue and Yervant Zorian",

note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 2019 IEEE International Test Conference, ITC 2019 ; Conference date: 09-11-2019 Through 15-11-2019",

year = "2019",

month = nov,

doi = "10.1109/ITC44170.2019.9000177",

language = "English",

series = "Proceedings - International Test Conference",

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Lee, KJ, Huang, SY, Li, H, Inoue, T & Zorian, Y 2019, International test conference in Asia (ITC-Asia) - Bridging ITC and test community in Asia. in 2019 IEEE International Test Conference, ITC 2019., 9000177, Proceedings - International Test Conference, vol. 2019-November, Institute of Electrical and Electronics Engineers Inc., 2019 IEEE International Test Conference, ITC 2019, Washington, United States, 19-11-09. https://doi.org/10.1109/ITC44170.2019.9000177

International test conference in Asia (ITC-Asia) - Bridging ITC and test community in Asia. / Lee, Kuen Jong; Huang, Shi Yu; Li, Huawei et al.
2019 IEEE International Test Conference, ITC 2019. Institute of Electrical and Electronics Engineers Inc., 2019. 9000177 (Proceedings - International Test Conference; Vol. 2019-November).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AB - ITC celebrates its 50th anniversary in 2019. Over its 50 years of history, the testing of an IC has undergone several stages of paradigm shifts. Today, it is still the most vital path leading to IC's quality, reliability, and robustness. Under this flagship conference, the test community has proliferated in almost every region in the world, following the footsteps of the expansion and diversification of our test industry. It is a constant evolution process, and ITC-Asia was born in 2017, to mark another milestone in this globalization process, with an attempt to integrate more people from both academia and industry, especially those in Asia, into a unified worldwide test community.

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M3 - Conference contribution

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International test conference in Asia (ITC-Asia) - Bridging ITC and test community in Asia

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