International test conference in Asia (ITC-Asia) - Bridging ITC and test community in Asia

Kuen Jong Lee, Shi Yu Huang, Huawei Li, Tomoo Inoue, Yervant Zorian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

ITC celebrates its 50th anniversary in 2019. Over its 50 years of history, the testing of an IC has undergone several stages of paradigm shifts. Today, it is still the most vital path leading to IC's quality, reliability, and robustness. Under this flagship conference, the test community has proliferated in almost every region in the world, following the footsteps of the expansion and diversification of our test industry. It is a constant evolution process, and ITC-Asia was born in 2017, to mark another milestone in this globalization process, with an attempt to integrate more people from both academia and industry, especially those in Asia, into a unified worldwide test community.

Original languageEnglish
Title of host publication2019 IEEE International Test Conference, ITC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728148236
DOIs
Publication statusPublished - 2019 Nov
Event2019 IEEE International Test Conference, ITC 2019 - Washington, United States
Duration: 2019 Nov 92019 Nov 15

Publication series

NameProceedings - International Test Conference
Volume2019-November
ISSN (Print)1089-3539

Conference

Conference2019 IEEE International Test Conference, ITC 2019
CountryUnited States
CityWashington
Period19-11-0919-11-15

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Applied Mathematics

Fingerprint Dive into the research topics of 'International test conference in Asia (ITC-Asia) - Bridging ITC and test community in Asia'. Together they form a unique fingerprint.

  • Cite this

    Lee, K. J., Huang, S. Y., Li, H., Inoue, T., & Zorian, Y. (2019). International test conference in Asia (ITC-Asia) - Bridging ITC and test community in Asia. In 2019 IEEE International Test Conference, ITC 2019 [9000177] (Proceedings - International Test Conference; Vol. 2019-November). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ITC44170.2019.9000177