Investigation of hot-carrier-induced degradation mechanisms in p-type high-voltage drain extended metal-oxide-semiconductor transistors

Jone-Fang Chen, Shiang Yu Chen, Kuo Ming Wu, C. M. Liu

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Fingerprint Dive into the research topics of 'Investigation of hot-carrier-induced degradation mechanisms in p-type high-voltage drain extended metal-oxide-semiconductor transistors'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy