Investigation of InP/InGaAs double heterojunction bipolar transistor (DHBT) with a step-graded InAlGaAs/InP collector structure

Tzu Pin Chen, Wei Hsin Chen, Kuei Yi Chu, Li Yang Chen, Chi Jhung Lee, Shiou Ying Cheng, Jung Hui Tsai, Wen Chau Liu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An interesting InP/InGaAs double heterojunction bipolar transistor (DHBT) with a step-graded InAlGaAs/InP collector structure are demonstrated and studied. By use of the step-graded InAlGaAs/InP collector structure at the base-collector heterojunction, the current blocking effect is effectively eliminated. Experimentally, the studied device shows a relatively better common-emitter breakdown voltage and low output conductance though at high temperature. Also, the studied device shows a wider collector current density operation region which over 11 decades in magnitude of collector current density (10-6 to 105 A/cm2). Moreover, the studied device also shows the relatively weaker temperature dependence on the electron impact ionization α. Consequently, the studied DHBT device provides the promise for low-voltage and low-power circuit applications.

Original languageEnglish
Title of host publicationIWJT-2008 - Extended Abstracts 2008 International Workshop on Junction Technology
Pages168-171
Number of pages4
DOIs
Publication statusPublished - 2008
EventIWJT-2008 - International Workshop on Junction Technology - Shanghai, China
Duration: 2008 May 152008 May 16

Publication series

NameIWJT-2008 - Extended Abstracts 2008 International Workshop on Junction Technology

Other

OtherIWJT-2008 - International Workshop on Junction Technology
Country/TerritoryChina
CityShanghai
Period08-05-1508-05-16

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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