Abstract
To investigate the possibility of preparing a nonalloyed ohmic contact to n-type GaN, the effects of GaN surface treatments on the metal/GaN interface were studied using x-ray photoelectron spectroscopy. A specific contact resistance of 5.0 × 10-5 Ω cm2 for the Ti/Al nonalloyed ohmic contacts to (NH4)2Sx-treated n-type GaN can be obtained. The nonalloyed ohmic contact formation would be impeded by the native oxide and the hydroxyl induced from the surface treatment of chemical solutions.
Original language | English |
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Pages (from-to) | 3986-3988 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 77 |
Issue number | 24 |
DOIs | |
Publication status | Published - 2000 Dec 11 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)