iScan: Indirect-access scan test over HOY test platform

Chao Wen Tzeng, Chun Yen Lin, Shi Yu Huang, Chih Tsun Huang, Jing Jia Liou, Hsi Pin Ma, Po Chiun Huang, Cheng Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

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Engineering & Materials Science