TY - JOUR
T1 - Lactic acid aided electrochemical deposition of c-axis preferred orientation of zinc oxide thin films
T2 - Structural and morphological features
AU - Whang, Thou Jen
AU - Hsieh, Mu Tao
AU - Tsai, Jia Ming
AU - Lee, Shyan Jer
N1 - Funding Information:
This work is supported by National Science Council of Taiwan and National Cheng Kung University .
PY - 2011/9/1
Y1 - 2011/9/1
N2 - Compact and homogeneous c-axis preferred orientation of zinc oxide (ZnO) films on indium tin oxide (ITO) coated glass have been prepared electrochemically at -1.2 V vs. AgAgCl in a weak acidic condition from 0.06 M Zn(NO 3 ) 2 with 3 mM lactic acid (LA) added. LA was found having strong influence on the electrodeposition of c-axis preferred orientation of zinc oxide films. Other experimental variables such as deposition temperature, potential, and precursor concentration were also conducted in this article. Among these variables, it was found that precursor concentration of zinc nitrate influenced significantly on growth direction and crystal diameter of zinc oxide. Cyclic voltammetry was used to observe the electrochemistry of the deposition. Crystallinities of the films were examined by X-ray diffractometer. The morphologies of zinc oxide films were observed with a field emitting scanning electron microscope. Optical characteristics of zinc oxide layers were measured with UV-vis spectrophotometer. The band gap of the deposited zinc oxide thin films was evaluated from the Tauc relationship of (αhν) 2 vs. hν, which was found to be 3.31 eV.
AB - Compact and homogeneous c-axis preferred orientation of zinc oxide (ZnO) films on indium tin oxide (ITO) coated glass have been prepared electrochemically at -1.2 V vs. AgAgCl in a weak acidic condition from 0.06 M Zn(NO 3 ) 2 with 3 mM lactic acid (LA) added. LA was found having strong influence on the electrodeposition of c-axis preferred orientation of zinc oxide films. Other experimental variables such as deposition temperature, potential, and precursor concentration were also conducted in this article. Among these variables, it was found that precursor concentration of zinc nitrate influenced significantly on growth direction and crystal diameter of zinc oxide. Cyclic voltammetry was used to observe the electrochemistry of the deposition. Crystallinities of the films were examined by X-ray diffractometer. The morphologies of zinc oxide films were observed with a field emitting scanning electron microscope. Optical characteristics of zinc oxide layers were measured with UV-vis spectrophotometer. The band gap of the deposited zinc oxide thin films was evaluated from the Tauc relationship of (αhν) 2 vs. hν, which was found to be 3.31 eV.
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U2 - 10.1016/j.apsusc.2011.06.058
DO - 10.1016/j.apsusc.2011.06.058
M3 - Article
AN - SCOPUS:80051551080
VL - 257
SP - 9539
EP - 9545
JO - Applied Surface Science
JF - Applied Surface Science
SN - 0169-4332
IS - 22
ER -