Layer-dependent band dispersion and correlations using tunable soft X-ray ARPES

N. Kamakura, Y. Takata, T. Tokushima, Y. Harada, A. Chainani, K. Kobayashi, S. Shin

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)


Soft X-ray Angle-Resolved Photoemission Spectroscopy is applied to study inplane band dispersions of nickel as a function of probing depth. Photon energies between hv = 190 and 780 eV were used to effectively probe up to ~ 3-7 layers (~ 5-12 ̊). The results show layer-dependent band dispersion of the Δ2↓, minority spin band which crosses the Fermi level in 3 or more layers, in contrast to the known top 1-2 layers dispersion obtained using ultra-violet rays. The layer dependence corresponds to an increased value of exchange splitting and suggests reduced-correlation effects in the bulk compared to the surface.

Original languageEnglish
Pages (from-to)240-246
Number of pages7
JournalEurophysics Letters
Issue number2
Publication statusPublished - 2004 Jul 15

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)


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