TY - JOUR
T1 - Layer-dependent band dispersion and correlations using tunable soft X-ray ARPES
AU - Kamakura, N.
AU - Takata, Y.
AU - Tokushima, T.
AU - Harada, Y.
AU - Chainani, A.
AU - Kobayashi, K.
AU - Shin, S.
PY - 2004/7/15
Y1 - 2004/7/15
N2 - Soft X-ray Angle-Resolved Photoemission Spectroscopy is applied to study inplane band dispersions of nickel as a function of probing depth. Photon energies between hv = 190 and 780 eV were used to effectively probe up to ~ 3-7 layers (~ 5-12 ̊). The results show layer-dependent band dispersion of the Δ2↓, minority spin band which crosses the Fermi level in 3 or more layers, in contrast to the known top 1-2 layers dispersion obtained using ultra-violet rays. The layer dependence corresponds to an increased value of exchange splitting and suggests reduced-correlation effects in the bulk compared to the surface.
AB - Soft X-ray Angle-Resolved Photoemission Spectroscopy is applied to study inplane band dispersions of nickel as a function of probing depth. Photon energies between hv = 190 and 780 eV were used to effectively probe up to ~ 3-7 layers (~ 5-12 ̊). The results show layer-dependent band dispersion of the Δ2↓, minority spin band which crosses the Fermi level in 3 or more layers, in contrast to the known top 1-2 layers dispersion obtained using ultra-violet rays. The layer dependence corresponds to an increased value of exchange splitting and suggests reduced-correlation effects in the bulk compared to the surface.
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U2 - 10.1209/epl/i2004-10052-6
DO - 10.1209/epl/i2004-10052-6
M3 - Article
AN - SCOPUS:3142769958
SN - 0295-5075
VL - 67
SP - 240
EP - 246
JO - Journal de Physique (Paris), Lettres
JF - Journal de Physique (Paris), Lettres
IS - 2
ER -