Line-Focus Acoustic Microscopy Measurements of Nb2O5/MgO and BaTiO3/LaAlO3 Thin-Film/Substrate Configurations

Y. C. Lee; J. D. Achenbach; S. R. Gilbert; B. A. Block; B. W. Wessels; M. J. Nystrom

doi:10.1109/58.384445

Line-Focus Acoustic Microscopy Measurements of Nb2O5/MgO and BaTiO3/LaAlO3 Thin-Film/Substrate Configurations

Y. C. Lee, J. D. Achenbach, S. R. Gilbert, B. A. Block, B. W. Wessels, M. J. Nystrom

Department of Mechanical Engineering

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

Line-focus acoustic microscopy has been used to measure the phase velocities of surface acoustic waves on bare MgO and bare LaAI03, and on Nb205/MgO and BaTi03/LaAI03 thin-film/substrate configurations. The thin films are polycrystalline materials. The substrates are anisotropic single-crystals. The measured angular variation of the surface acoustic wave velocities has been used to determine the elastic constants of MgO substrate and Nb205 thin-film. It has been assumed that the Nb205 films may be considered as essentially isotropic. The measurements for LaAI03 and BaTi03/LaAI03 show anomalies which are attributed to twinning in the LaAI03 substrate.

Original language	English
Pages (from-to)	376-380
Number of pages	5
Journal	IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control
Volume	42
Issue number	3
DOIs	https://doi.org/10.1109/58.384445
Publication status	Published - 1995 May

All Science Journal Classification (ASJC) codes

Instrumentation
Acoustics and Ultrasonics
Electrical and Electronic Engineering

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@article{bd583c8e07364e5bad7b6694b62c7394,

title = "Line-Focus Acoustic Microscopy Measurements of Nb2O5/MgO and BaTiO3/LaAlO3 Thin-Film/Substrate Configurations",

abstract = "Line-focus acoustic microscopy has been used to measure the phase velocities of surface acoustic waves on bare MgO and bare LaAI03, and on Nb205/MgO and BaTi03/LaAI03 thin-film/substrate configurations. The thin films are polycrystalline materials. The substrates are anisotropic single-crystals. The measured angular variation of the surface acoustic wave velocities has been used to determine the elastic constants of MgO substrate and Nb205 thin-film. It has been assumed that the Nb205 films may be considered as essentially isotropic. The measurements for LaAI03 and BaTi03/LaAI03 show anomalies which are attributed to twinning in the LaAI03 substrate.",

author = "Lee, {Y. C.} and Achenbach, {J. D.} and Gilbert, {S. R.} and Block, {B. A.} and Wessels, {B. W.} and Nystrom, {M. J.}",

note = "Funding Information: Manuscript received May 26, 1994; revised October 3, 1994; accepted October 5, 1994. This work was sponsored by the Department of Energy under Contract No. DE-FG02-86ER13484 and DE-FG02-85ER45209. Y.-C. Lee and J. D. Achenbach are with the Center for Quality Engineering and Failure Prevention, Northwestern University, Evanston, IL 60208 USA. N. J. Nystrom, S. R. Gilbert, B. A. Block, and B. W. Wessels are with the Department of Materials Science and Engineering, Northwestern University Evanston, IL 60208 USA. IEEE Log Number 9409924.",

year = "1995",

month = may,

doi = "10.1109/58.384445",

language = "English",

volume = "42",

pages = "376--380",

journal = "IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control",

issn = "0885-3010",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "3",

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T1 - Line-Focus Acoustic Microscopy Measurements of Nb2O5/MgO and BaTiO3/LaAlO3 Thin-Film/Substrate Configurations

AU - Lee, Y. C.

AU - Achenbach, J. D.

AU - Gilbert, S. R.

AU - Block, B. A.

AU - Wessels, B. W.

AU - Nystrom, M. J.

N1 - Funding Information: Manuscript received May 26, 1994; revised October 3, 1994; accepted October 5, 1994. This work was sponsored by the Department of Energy under Contract No. DE-FG02-86ER13484 and DE-FG02-85ER45209. Y.-C. Lee and J. D. Achenbach are with the Center for Quality Engineering and Failure Prevention, Northwestern University, Evanston, IL 60208 USA. N. J. Nystrom, S. R. Gilbert, B. A. Block, and B. W. Wessels are with the Department of Materials Science and Engineering, Northwestern University Evanston, IL 60208 USA. IEEE Log Number 9409924.

PY - 1995/5

Y1 - 1995/5

N2 - Line-focus acoustic microscopy has been used to measure the phase velocities of surface acoustic waves on bare MgO and bare LaAI03, and on Nb205/MgO and BaTi03/LaAI03 thin-film/substrate configurations. The thin films are polycrystalline materials. The substrates are anisotropic single-crystals. The measured angular variation of the surface acoustic wave velocities has been used to determine the elastic constants of MgO substrate and Nb205 thin-film. It has been assumed that the Nb205 films may be considered as essentially isotropic. The measurements for LaAI03 and BaTi03/LaAI03 show anomalies which are attributed to twinning in the LaAI03 substrate.

AB - Line-focus acoustic microscopy has been used to measure the phase velocities of surface acoustic waves on bare MgO and bare LaAI03, and on Nb205/MgO and BaTi03/LaAI03 thin-film/substrate configurations. The thin films are polycrystalline materials. The substrates are anisotropic single-crystals. The measured angular variation of the surface acoustic wave velocities has been used to determine the elastic constants of MgO substrate and Nb205 thin-film. It has been assumed that the Nb205 films may be considered as essentially isotropic. The measurements for LaAI03 and BaTi03/LaAI03 show anomalies which are attributed to twinning in the LaAI03 substrate.

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Line-Focus Acoustic Microscopy Measurements of Nb2O5/MgO and BaTiO3/LaAlO3 Thin-Film/Substrate Configurations

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