Abstract
Line-focus acoustic microscopy has been used to measure the phase velocities of surface acoustic waves on bare MgO and bare LaAI03, and on Nb205/MgO and BaTi03/LaAI03 thin-film/substrate configurations. The thin films are polycrystalline materials. The substrates are anisotropic single-crystals. The measured angular variation of the surface acoustic wave velocities has been used to determine the elastic constants of MgO substrate and Nb205 thin-film. It has been assumed that the Nb205 films may be considered as essentially isotropic. The measurements for LaAI03 and BaTi03/LaAI03 show anomalies which are attributed to twinning in the LaAI03 substrate.
Original language | English |
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Pages (from-to) | 376-380 |
Number of pages | 5 |
Journal | IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control |
Volume | 42 |
Issue number | 3 |
DOIs | |
Publication status | Published - 1995 May |
All Science Journal Classification (ASJC) codes
- Instrumentation
- Acoustics and Ultrasonics
- Electrical and Electronic Engineering