Original language | English |
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Title of host publication | 7th International Symposium on IC Technology, Systems & Applications (ISIC) |
Place of Publication | Singapore |
Pages | 212-215 |
Publication status | Published - 1997 Sept |
Logic testing of switch-level faults for CMOS unate networks
Y.-R. Shieh, Cheng-Wen Wu
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution