Low-complexity Reed-Solomon decoder for blu-ray disc applications

Yung Kuei Lu, Ming-Der Shieh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

This paper presents a low-complexity Reed-Solomon decoder design for Blu-ray Disc (BD) applications. By employing the developed folding scheme, the resulting decoder design, based on the modified Euclidean (ME) algorithm proposed by Truong, can effectively reduce the hardware cost and meet the throughput requirement of BD applications. Compared with the related work, our development not only provides a lower area requirement but also has a simpler control mechanism. Experimental results show that the developed decoder can operate at 200MHz with a total gate count of 49,168, and achieve a throughput rate of 1.55Gbps for BD applications when implemented with the TSMC 0.18μm process.

Original languageEnglish
Title of host publicationProceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010
Pages359-362
Number of pages4
DOIs
Publication statusPublished - 2010 Nov 8
Event2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010 - Hsin Chu, Taiwan
Duration: 2010 Apr 262010 Apr 29

Publication series

NameProceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010

Other

Other2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010
CountryTaiwan
CityHsin Chu
Period10-04-2610-04-29

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Throughput
Hardware
Costs

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Lu, Y. K., & Shieh, M-D. (2010). Low-complexity Reed-Solomon decoder for blu-ray disc applications. In Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010 (pp. 359-362). [5496762] (Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010). https://doi.org/10.1109/VDAT.2010.5496762
Lu, Yung Kuei ; Shieh, Ming-Der. / Low-complexity Reed-Solomon decoder for blu-ray disc applications. Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010. 2010. pp. 359-362 (Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010).
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abstract = "This paper presents a low-complexity Reed-Solomon decoder design for Blu-ray Disc (BD) applications. By employing the developed folding scheme, the resulting decoder design, based on the modified Euclidean (ME) algorithm proposed by Truong, can effectively reduce the hardware cost and meet the throughput requirement of BD applications. Compared with the related work, our development not only provides a lower area requirement but also has a simpler control mechanism. Experimental results show that the developed decoder can operate at 200MHz with a total gate count of 49,168, and achieve a throughput rate of 1.55Gbps for BD applications when implemented with the TSMC 0.18μm process.",
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Lu, YK & Shieh, M-D 2010, Low-complexity Reed-Solomon decoder for blu-ray disc applications. in Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010., 5496762, Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010, pp. 359-362, 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010, Hsin Chu, Taiwan, 10-04-26. https://doi.org/10.1109/VDAT.2010.5496762

Low-complexity Reed-Solomon decoder for blu-ray disc applications. / Lu, Yung Kuei; Shieh, Ming-Der.

Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010. 2010. p. 359-362 5496762 (Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Lu YK, Shieh M-D. Low-complexity Reed-Solomon decoder for blu-ray disc applications. In Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010. 2010. p. 359-362. 5496762. (Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010). https://doi.org/10.1109/VDAT.2010.5496762