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Low-frequency noise characterization of amorphous InGaZnO thin-film transistors with double-stack Ga2O3/SiO2 dielectric
T. H. Chang, C. J. Chiu, S. J. Chang, T. H. Yang, S. L. Wu, W. Y. Weng
Research output: Contribution to journal › Article › peer-review
5
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(Scopus)