Low-frequency noise properties of metal-organic-metal ultraviolet sensors

Peng Yin Su, Ricky Wenkuei Chuang, Chin Hsiang Chen, Tsung Hsien Kao

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

For this study, the metal-organic-metal (MOM) ultraviolet (UV) sensors with organic 4,4′,4′′-tris[3-methylphenyl(phenyl)amino]triphenylamine (m-MTDATA) thin films of various thicknesses were fabricated successfully, and their low-frequency noise (LFN) characteristics were also analyzed. The findings revealed that the UV-to-visible rejection ratio of the fabricated 80-nm-thick m-MTDATA UV sensor was approximately 7.81 when biased at 5V, with a cutoff at 220 nm. With an incident light wavelength of 220nm and an applied bias of 5V, the measured responsivity of the 80-nm-thick m-MTDATA UV sensor was found to be 2.84 × 10-4A/W. Furthermore, a noise-equivalent power (NEP) of 9.8 × 10-11W and a detectivity (D∗) of 8.3 × 108cmHz0.5W-1 can be achieved using the fabricated 80-nm-thick m-MTDATA UV sensor.

Original languageEnglish
Article number04DK12
JournalJapanese Journal of Applied Physics
Volume54
Issue number4
DOIs
Publication statusPublished - 2015 Apr 1

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

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