Low-frequency noise properties of metal-organic-metal ultraviolet sensors

Peng Yin Su; Ricky Wenkuei Chuang; Chin Hsiang Chen; Tsung Hsien Kao

doi:10.7567/JJAP.54.04DK12

Low-frequency noise properties of metal-organic-metal ultraviolet sensors

Peng Yin Su, Ricky Wenkuei Chuang, Chin Hsiang Chen, Tsung Hsien Kao

Research output: Contribution to journal › Article › peer-review

Abstract

For this study, the metal-organic-metal (MOM) ultraviolet (UV) sensors with organic 4,4′,4′′-tris[3-methylphenyl(phenyl)amino]triphenylamine (m-MTDATA) thin films of various thicknesses were fabricated successfully, and their low-frequency noise (LFN) characteristics were also analyzed. The findings revealed that the UV-to-visible rejection ratio of the fabricated 80-nm-thick m-MTDATA UV sensor was approximately 7.81 when biased at 5V, with a cutoff at 220 nm. With an incident light wavelength of 220nm and an applied bias of 5V, the measured responsivity of the 80-nm-thick m-MTDATA UV sensor was found to be 2.84 × 10^-4A/W. Furthermore, a noise-equivalent power (NEP) of 9.8 × 10^-11W and a detectivity (D∗) of 8.3 × 10⁸cmHz^0.5W^-1 can be achieved using the fabricated 80-nm-thick m-MTDATA UV sensor.

Original language	English
Article number	04DK12
Journal	Japanese journal of applied physics
Volume	54
Issue number	4
DOIs	https://doi.org/10.7567/JJAP.54.04DK12
Publication status	Published - 2015 Apr 1

All Science Journal Classification (ASJC) codes

General Engineering
General Physics and Astronomy

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title = "Low-frequency noise properties of metal-organic-metal ultraviolet sensors",

abstract = "For this study, the metal-organic-metal (MOM) ultraviolet (UV) sensors with organic 4,4′,4′′-tris[3-methylphenyl(phenyl)amino]triphenylamine (m-MTDATA) thin films of various thicknesses were fabricated successfully, and their low-frequency noise (LFN) characteristics were also analyzed. The findings revealed that the UV-to-visible rejection ratio of the fabricated 80-nm-thick m-MTDATA UV sensor was approximately 7.81 when biased at 5V, with a cutoff at 220 nm. With an incident light wavelength of 220nm and an applied bias of 5V, the measured responsivity of the 80-nm-thick m-MTDATA UV sensor was found to be 2.84 × 10-4A/W. Furthermore, a noise-equivalent power (NEP) of 9.8 × 10-11W and a detectivity (D∗) of 8.3 × 108cmHz0.5W-1 can be achieved using the fabricated 80-nm-thick m-MTDATA UV sensor.",

author = "Su, {Peng Yin} and Chuang, {Ricky Wenkuei} and Chen, {Chin Hsiang} and Kao, {Tsung Hsien}",

note = "Publisher Copyright: {\textcopyright} 2015 The Japan Society of Applied Physics.",

year = "2015",

month = apr,

day = "1",

doi = "10.7567/JJAP.54.04DK12",

language = "English",

volume = "54",

journal = "Japanese journal of applied physics",

issn = "0021-4922",

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T1 - Low-frequency noise properties of metal-organic-metal ultraviolet sensors

AU - Su, Peng Yin

AU - Chuang, Ricky Wenkuei

AU - Chen, Chin Hsiang

AU - Kao, Tsung Hsien

PY - 2015/4/1

Y1 - 2015/4/1

N2 - For this study, the metal-organic-metal (MOM) ultraviolet (UV) sensors with organic 4,4′,4′′-tris[3-methylphenyl(phenyl)amino]triphenylamine (m-MTDATA) thin films of various thicknesses were fabricated successfully, and their low-frequency noise (LFN) characteristics were also analyzed. The findings revealed that the UV-to-visible rejection ratio of the fabricated 80-nm-thick m-MTDATA UV sensor was approximately 7.81 when biased at 5V, with a cutoff at 220 nm. With an incident light wavelength of 220nm and an applied bias of 5V, the measured responsivity of the 80-nm-thick m-MTDATA UV sensor was found to be 2.84 × 10-4A/W. Furthermore, a noise-equivalent power (NEP) of 9.8 × 10-11W and a detectivity (D∗) of 8.3 × 108cmHz0.5W-1 can be achieved using the fabricated 80-nm-thick m-MTDATA UV sensor.

AB - For this study, the metal-organic-metal (MOM) ultraviolet (UV) sensors with organic 4,4′,4′′-tris[3-methylphenyl(phenyl)amino]triphenylamine (m-MTDATA) thin films of various thicknesses were fabricated successfully, and their low-frequency noise (LFN) characteristics were also analyzed. The findings revealed that the UV-to-visible rejection ratio of the fabricated 80-nm-thick m-MTDATA UV sensor was approximately 7.81 when biased at 5V, with a cutoff at 220 nm. With an incident light wavelength of 220nm and an applied bias of 5V, the measured responsivity of the 80-nm-thick m-MTDATA UV sensor was found to be 2.84 × 10-4A/W. Furthermore, a noise-equivalent power (NEP) of 9.8 × 10-11W and a detectivity (D∗) of 8.3 × 108cmHz0.5W-1 can be achieved using the fabricated 80-nm-thick m-MTDATA UV sensor.

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Low-frequency noise properties of metal-organic-metal ultraviolet sensors

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