A low voltage built-in current sensor (BICS) for IDDQ testing based on the bulk-driven current mirror technique is proposed. This design has a small overhead in terms of area and needs only one external power supply. Different current resolution requirements can be met by adjusting the aspect ratio of the transistors in the design. HSPICE simulation results show that high error detection speed and small performance impact on the original circuit are also achieved.
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering