Low voltage built-in current sensor

Kuen-Jong Lee, Kou Shung Huang, Min Cheng Huang

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A low voltage built-in current sensor (BICS) for IDDQ testing based on the bulk-driven current mirror technique is proposed. This design has a small overhead in terms of area and needs only one external power supply. Different current resolution requirements can be met by adjusting the aspect ratio of the transistors in the design. HSPICE simulation results show that high error detection speed and small performance impact on the original circuit are also achieved.

Original languageEnglish
Pages (from-to)1942-1943
Number of pages2
JournalElectronics Letters
Volume32
Issue number21
DOIs
Publication statusPublished - 1996 Jan 1

Fingerprint

Error detection
Sensors
Electric potential
Aspect ratio
Transistors
Mirrors
Networks (circuits)
Testing

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Lee, Kuen-Jong ; Huang, Kou Shung ; Huang, Min Cheng. / Low voltage built-in current sensor. In: Electronics Letters. 1996 ; Vol. 32, No. 21. pp. 1942-1943.
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Lee, K-J, Huang, KS & Huang, MC 1996, 'Low voltage built-in current sensor', Electronics Letters, vol. 32, no. 21, pp. 1942-1943. https://doi.org/10.1049/el:19961296

Low voltage built-in current sensor. / Lee, Kuen-Jong; Huang, Kou Shung; Huang, Min Cheng.

In: Electronics Letters, Vol. 32, No. 21, 01.01.1996, p. 1942-1943.

Research output: Contribution to journalArticle

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