Low Vt Metal-Gate/High-k CMOS From Understanding the Mechanism to Innovative Solution

Shui-Jinn Wang, A. Chin, C. H. Cheng, N. C. Su, C. C. Liao, C. P. Chou, H.L. Hwang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationInternational Conference on Solid State Devices and materials (SSDM'08)
Place of PublicationTsukuba
Publication statusPublished - 2008 Sep 23

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