Magnetic anisotropy of permalloy film on stepped Mo(001) surface

C. C. Yu, J. C.A. Huang, C. H. Lee

Research output: Contribution to journalConference article

Abstract

Permalloy (Py=Ni80Fe20) films were grown on stepped Mo (001) surface. The crystal structure and epitaxial relations of the films were examined by reflection high-energy electron diffraction (RHEED) and x-ray diffraction (XRD). The surface morphology and magnetic anisotropy properties of the films were determined by atomic force microscopy (AFM) and longitudinal magneto-optical Kerr effect (LMOKE) measurements.

Original languageEnglish
Pages (from-to)BS-07
JournalDigests of the Intermag Conference
Publication statusPublished - 2000 Jan 1
Event2000 IEEE International Magnetics Conference-2000 IEEE INTERMAG - Toronto, Ont, Can
Duration: 2000 Apr 92000 Apr 13

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Magnetic anisotropy
Optical Kerr effect
Reflection high energy electron diffraction
Surface morphology
Atomic force microscopy
Diffraction
Crystal structure
X rays

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

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abstract = "Permalloy (Py=Ni80Fe20) films were grown on stepped Mo (001) surface. The crystal structure and epitaxial relations of the films were examined by reflection high-energy electron diffraction (RHEED) and x-ray diffraction (XRD). The surface morphology and magnetic anisotropy properties of the films were determined by atomic force microscopy (AFM) and longitudinal magneto-optical Kerr effect (LMOKE) measurements.",
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Magnetic anisotropy of permalloy film on stepped Mo(001) surface. / Yu, C. C.; Huang, J. C.A.; Lee, C. H.

In: Digests of the Intermag Conference, 01.01.2000, p. BS-07.

Research output: Contribution to journalConference article

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AU - Huang, J. C.A.

AU - Lee, C. H.

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N2 - Permalloy (Py=Ni80Fe20) films were grown on stepped Mo (001) surface. The crystal structure and epitaxial relations of the films were examined by reflection high-energy electron diffraction (RHEED) and x-ray diffraction (XRD). The surface morphology and magnetic anisotropy properties of the films were determined by atomic force microscopy (AFM) and longitudinal magneto-optical Kerr effect (LMOKE) measurements.

AB - Permalloy (Py=Ni80Fe20) films were grown on stepped Mo (001) surface. The crystal structure and epitaxial relations of the films were examined by reflection high-energy electron diffraction (RHEED) and x-ray diffraction (XRD). The surface morphology and magnetic anisotropy properties of the films were determined by atomic force microscopy (AFM) and longitudinal magneto-optical Kerr effect (LMOKE) measurements.

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