Magnetic depth profile at the interface of a permalloy/Co thin film studied by polarized neutron and X-ray reflectivity

Chih Hao Lee, Kuan Li Yu, Ming Han Lee, J. C.A. Huang, G. P. Felcher

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Polarized neutron and X-ray reflectivity are complementary tools for measuring the magnetic depth profile of a thin film. In this experiment, permalloy (Ni80Fe20, 30 nm) thin film was deposited on Al2O3(1 1̄ 0 0) substrates with Co(8 nm)/Mo(18 nm) as buffer layers. The depth profile between the permalloy and Co cannot be determined by X-ray reflectivity alone because the electron densities are too close together. Polarized neutron reflectivity, although available only with limited q range available, can determine the interface roughness between the permalloy and Co layer.

Original languageEnglish
Article number12826
Pages (from-to)110-112
Number of pages3
JournalJournal of Magnetism and Magnetic Materials
Volume209
Issue number1-3
DOIs
Publication statusPublished - 2000 Jan 1

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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