Manganese concentration and low-temperature annealing dependence of (formula presented) by x-ray absorption spectroscopy

Y. Ishiwata, M. Watanabe, R. Eguchi, T. Takeuchi, Y. Harada, A. Chainani, S. Shin, T. Hayashi, Y. Hashimoto, S. Katsumoto, Y. Iye

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

The Mn-site-projected electronic structure of the diluted magnetic semiconductors (formula presented) (formula presented) 0.038, 0.047, 0.052, 0.058) of as-grown and low-temperature (LT) annealed samples are systematically studied using high-resolution Mn (formula presented) absorption spectroscopy. The study exhibits coexistence of the ferromagnetic (formula presented) ion and the paramagnetic Mn-As complex that transforms into the ferromagnetic component with LT annealing. The ratio of ferromagnetic to paramagnetic components is directly related to the x dependence of the hole density and ferromagnetic critical temperature.

Original languageEnglish
Pages (from-to)1-4
Number of pages4
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume65
Issue number23
DOIs
Publication statusPublished - 2002

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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