Measured minority-carrier lifetime and CIGS device performance

Ingrid L. Repins; Wyatt K. Metzger; Craig L. Perkins; Jian V. Li; Miguel A. Contreras

doi:10.1109/PVSC.2009.5411126

Measured minority-carrier lifetime and CIGS device performance

Ingrid L. Repins
, Wyatt K. Metzger
, Craig L. Perkins
, Jian V. Li
, Miguel A. Contreras

Department of Aeronautics and Astronautics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

23 Citations (Scopus)

Abstract

The relationship between lifetime measured by time-resolved photoluminescence on bare CIGS films and subsequent device performance is examined. A correlation between device voltage and lifetime is demonstrated. The effects of measured band gap and carrier density are discussed. Results are compared with fundamental calculations.

Original language	English
Title of host publication	2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009
Pages	978-983
Number of pages	6
DOIs	https://doi.org/10.1109/PVSC.2009.5411126
Publication status	Published - 2009
Event	2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009 - Philadelphia, PA, United States Duration: 2009 Jun 7 → 2009 Jun 12

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

Other

Other	2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009
Country/Territory	United States
City	Philadelphia, PA
Period	09-06-07 → 09-06-12

All Science Journal Classification (ASJC) codes

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

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10.1109/PVSC.2009.5411126

Cite this

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title = "Measured minority-carrier lifetime and CIGS device performance",

abstract = "The relationship between lifetime measured by time-resolved photoluminescence on bare CIGS films and subsequent device performance is examined. A correlation between device voltage and lifetime is demonstrated. The effects of measured band gap and carrier density are discussed. Results are compared with fundamental calculations.",

author = "Repins, \{Ingrid L.\} and Metzger, \{Wyatt K.\} and Perkins, \{Craig L.\} and Li, \{Jian V.\} and Contreras, \{Miguel A.\}",

year = "2009",

doi = "10.1109/PVSC.2009.5411126",

language = "English",

isbn = "9781424429509",

series = "Conference Record of the IEEE Photovoltaic Specialists Conference",

pages = "978--983",

booktitle = "2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009",

note = "2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009 ; Conference date: 07-06-2009 Through 12-06-2009",

}

Repins, IL, Metzger, WK, Perkins, CL, Li, JV & Contreras, MA 2009, Measured minority-carrier lifetime and CIGS device performance. in 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009., 5411126, Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 978-983, 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009, Philadelphia, PA, United States, 09-06-07. https://doi.org/10.1109/PVSC.2009.5411126

Measured minority-carrier lifetime and CIGS device performance. / Repins, Ingrid L.; Metzger, Wyatt K.; Perkins, Craig L. et al.
2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009. 2009. p. 978-983 5411126 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Measured minority-carrier lifetime and CIGS device performance

AU - Repins, Ingrid L.

AU - Metzger, Wyatt K.

AU - Perkins, Craig L.

AU - Li, Jian V.

AU - Contreras, Miguel A.

PY - 2009

Y1 - 2009

N2 - The relationship between lifetime measured by time-resolved photoluminescence on bare CIGS films and subsequent device performance is examined. A correlation between device voltage and lifetime is demonstrated. The effects of measured band gap and carrier density are discussed. Results are compared with fundamental calculations.

AB - The relationship between lifetime measured by time-resolved photoluminescence on bare CIGS films and subsequent device performance is examined. A correlation between device voltage and lifetime is demonstrated. The effects of measured band gap and carrier density are discussed. Results are compared with fundamental calculations.

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DO - 10.1109/PVSC.2009.5411126

M3 - Conference contribution

AN - SCOPUS:77951578594

SN - 9781424429509

T3 - Conference Record of the IEEE Photovoltaic Specialists Conference

SP - 978

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BT - 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009

T2 - 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009

Y2 - 7 June 2009 through 12 June 2009

ER -

Measured minority-carrier lifetime and CIGS device performance

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All Science Journal Classification (ASJC) codes

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