Measurement and tracking control of the Z-tilts error compensating stage of the nano-measuring machine

Van Tsai Liu, Chien Hung Liu, Hau Wei Li, Chieh Li Chen, Chun Liang Lin, Yu Chen Lin

Research output: Contribution to journalArticlepeer-review


Purpose: The purpose of this paper is to develop the multi-degree-of-freedom measurement system to test, verify, and control the nano-measuring machine. Design/methodology/approach: A generic differential model approach is constructed to numerically describe the hysteresis effects of piezoelectric actuators. Based on the generic differential model, a feedforward compensator with a proportional integral (PI) type controller is designed to compensate for the hysteresis nonlinearity of a piezoelectric actuated three degree-of-freedom coplanar nanostage which can provide high-precision applications. Findings: The Z-tilts (z, pitch, and roll motion) error compensation stage of the nano-measuring machine is accomplished. Moreover, a high-resolution laser interferometer is used to measure position accurately. Originality/value: This paper contributes to develop a tracking control design method for the piezoelectric motion platform which combines a closed-loop feedforward compensator with a PI type controller.

Original languageEnglish
Pages (from-to)1029-1039
Number of pages11
Issue number6
Publication statusPublished - 2010 Jan 1

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Theoretical Computer Science
  • Computer Science (miscellaneous)
  • Engineering (miscellaneous)
  • Social Sciences (miscellaneous)


Dive into the research topics of 'Measurement and tracking control of the Z-tilts error compensating stage of the nano-measuring machine'. Together they form a unique fingerprint.

Cite this