Measurement of absolute displacement by a double-modulation technique based on a Michelson interferometer

Lih Wuu Chang, Pie Yau Chien, Ching Ting Lee

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

A novel method is presented for of measuring absolute displacement with a synthesized wavelength interferometer. The optical phase of the interferometer is simultaneously modulated with a frequencymodulated laser diode and optical path-length difference. The error signal originating from the intensity modulation of the source is eliminated by a signal processing circuit. In addition, a lock-in technique is used to demodulate the envelope of the interferometric signal. The displacement signal is derived by the self-mixing technique.

Original languageEnglish
Pages (from-to)2843-2847
Number of pages5
JournalApplied Optics
Volume38
Issue number13
DOIs
Publication statusPublished - 1999 May 1

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

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