Abstract
A novel method is presented for of measuring absolute displacement with a synthesized wavelength interferometer. The optical phase of the interferometer is simultaneously modulated with a frequencymodulated laser diode and optical path-length difference. The error signal originating from the intensity modulation of the source is eliminated by a signal processing circuit. In addition, a lock-in technique is used to demodulate the envelope of the interferometric signal. The displacement signal is derived by the self-mixing technique.
Original language | English |
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Pages (from-to) | 2843-2847 |
Number of pages | 5 |
Journal | Applied optics |
Volume | 38 |
Issue number | 13 |
DOIs | |
Publication status | Published - 1999 May 1 |
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering