Measurement of the magnetoelectric coefficient using a scanning evanescent microwave microscope

Chen Gao, Bo Hu, Xuefei Li, Chihui Liu, M. Murakami, K. S. Chang, C. J. Long, M. Wuttig, I. Takeuchi

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Abstract

A quantitative magnetoelectric coefficient measurement method was developed based on scanning evanescent microwave microscopy. This unique technique does not require electrodes and has advantages that it has a high spatial resolution and can simultaneously measure other related properties such as the nonlinear dielectric constant. We have demonstrated that this technique can detect the magnetoelectric coefficient of thin film samples as low as 10 mVcm Oe.

Original languageEnglish
Article number153505
Pages (from-to)1-3
Number of pages3
JournalApplied Physics Letters
Volume87
Issue number15
DOIs
Publication statusPublished - 2005 Oct 10

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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  • Cite this

    Gao, C., Hu, B., Li, X., Liu, C., Murakami, M., Chang, K. S., Long, C. J., Wuttig, M., & Takeuchi, I. (2005). Measurement of the magnetoelectric coefficient using a scanning evanescent microwave microscope. Applied Physics Letters, 87(15), 1-3. [153505]. https://doi.org/10.1063/1.2093925