A quantitative magnetoelectric coefficient measurement method was developed based on scanning evanescent microwave microscopy. This unique technique does not require electrodes and has advantages that it has a high spatial resolution and can simultaneously measure other related properties such as the nonlinear dielectric constant. We have demonstrated that this technique can detect the magnetoelectric coefficient of thin film samples as low as 10 mVcm Oe.
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)