Memory effects related to deep levels in metal-oxide-semiconductor structure with nanocrystalline Si

  • Young Hae Kwon
  • , C. J. Park
  • , W. C. Lee
  • , D. J. Fu
  • , Y. Shon
  • , T. W. Kang
  • , C. Y. Hong
  • , H. Y. Cho
  • , Kang L. Wang

Research output: Contribution to journal › Article › peer-review

54   Link opens in a new tab Citations (Scopus)

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