Memory fault diagnosis by syndrome compression

Jin Fu Li, Cheng Wen Wu

Research output: Contribution to journalConference article

27 Citations (Scopus)

Abstract

In this paper we present a data compression technique that can be used to speed up the transmission of diagnosis data from the embedded RAM with built-in self-diagnosis (BISD) support. The proposed approach compresses the faulty-cell address and March syndrome to about 28% of the original size under the March-17N diagnostic test algorithm. The key component of the compressor is a novel syndrome-accumulation circuit, which can be realized by a content-addressable memory. Experimental results show that the area overhead is about 0.9% for a 1Mb SRAM with 164 faults. The proposed compression technique reduces the time for diagnostic test, as well as the tester storage capacity requirement.

Original languageEnglish
Article number915007
Pages (from-to)97-101
Number of pages5
JournalProceedings -Design, Automation and Test in Europe, DATE
DOIs
Publication statusPublished - 2001 Dec 1
EventDesign, Automation and Test in Europe Conference and Exhibition 2001, DATE 2001 - Munich, Germany
Duration: 2001 Mar 132001 Mar 16

Fingerprint

Failure analysis
Associative storage
Data storage equipment
Static random access storage
Data compression
Random access storage
Compressors
Networks (circuits)

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

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abstract = "In this paper we present a data compression technique that can be used to speed up the transmission of diagnosis data from the embedded RAM with built-in self-diagnosis (BISD) support. The proposed approach compresses the faulty-cell address and March syndrome to about 28{\%} of the original size under the March-17N diagnostic test algorithm. The key component of the compressor is a novel syndrome-accumulation circuit, which can be realized by a content-addressable memory. Experimental results show that the area overhead is about 0.9{\%} for a 1Mb SRAM with 164 faults. The proposed compression technique reduces the time for diagnostic test, as well as the tester storage capacity requirement.",
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Memory fault diagnosis by syndrome compression. / Li, Jin Fu; Wu, Cheng Wen.

In: Proceedings -Design, Automation and Test in Europe, DATE, 01.12.2001, p. 97-101.

Research output: Contribution to journalConference article

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