Message from the general chairs

Research output: Contribution to journal › Editorial › peer-review

Original language	English
Article number	4547600
Pages (from-to)	2-4
Number of pages	3
Journal	Records of the IEEE International Workshop on Memory Technology, Design and Testing
DOIs	https://doi.org/10.1109/MTDT.2007.4547600
Publication status	Published - 2007 Dec 1
Event	17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007 - Taipei, Taiwan Duration: 2007 Dec 3 → 2007 Dec 5

All Science Journal Classification (ASJC) codes

@article{1fabf24df84f4ef6a056ca58381966a3,

title = "Message from the general chairs",

author = "Wei Hwang and Wu, {Cheng Wen}",

year = "2007",

month = dec,

day = "1",

doi = "10.1109/MTDT.2007.4547600",

language = "English",

pages = "2--4",

journal = "Records of the IEEE International Workshop on Memory Technology, Design and Testing",

issn = "1087-4852",

publisher = "IEEE Computer Society",

note = "17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007 ; Conference date: 03-12-2007 Through 05-12-2007",

}

TY - JOUR

T1 - Message from the general chairs

AU - Hwang, Wei

AU - Wu, Cheng Wen

PY - 2007/12/1

Y1 - 2007/12/1

UR - http://www.scopus.com/inward/record.url?scp=50849136139&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=50849136139&partnerID=8YFLogxK

U2 - 10.1109/MTDT.2007.4547600

DO - 10.1109/MTDT.2007.4547600

M3 - Editorial

AN - SCOPUS:50849136139

SP - 2

EP - 4

JO - Records of the IEEE International Workshop on Memory Technology, Design and Testing

JF - Records of the IEEE International Workshop on Memory Technology, Design and Testing

SN - 1087-4852

M1 - 4547600

T2 - 17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007

Y2 - 3 December 2007 through 5 December 2007

ER -