Message from the general chairs

Wei Hwang; Cheng Wen Wu

doi:10.1109/MTDT.2007.4547600

Message from the general chairs

Wei Hwang
, Cheng Wen Wu

Department of Electrical Engineering

Research output: Contribution to journal › Editorial › peer-review

Original language	English
Article number	4547600
Pages (from-to)	2-4
Number of pages	3
Journal	Records of the IEEE International Workshop on Memory Technology, Design and Testing
DOIs	https://doi.org/10.1109/MTDT.2007.4547600
Publication status	Published - 2007 Dec 1
Event	17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007 - Taipei, Taiwan Duration: 2007 Dec 3 → 2007 Dec 5

All Science Journal Classification (ASJC) codes

Media Technology

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10.1109/MTDT.2007.4547600

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title = "Message from the general chairs",

author = "Wei Hwang and Wu, \{Cheng Wen\}",

year = "2007",

month = dec,

day = "1",

doi = "10.1109/MTDT.2007.4547600",

language = "English",

pages = "2--4",

journal = "Records of the IEEE International Workshop on Memory Technology, Design and Testing",

issn = "1087-4852",

publisher = "IEEE Computer Society",

note = "17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007 ; Conference date: 03-12-2007 Through 05-12-2007",

}

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AU - Wu, Cheng Wen

PY - 2007/12/1

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DO - 10.1109/MTDT.2007.4547600

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JO - Records of the IEEE International Workshop on Memory Technology, Design and Testing

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T2 - 17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007

Y2 - 3 December 2007 through 5 December 2007

ER -

Message from the general chairs

All Science Journal Classification (ASJC) codes

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