Abstract
| Original language | English |
|---|---|
| Patent number | 9508042 |
| Publication status | Published - 2014 May 8 |
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METHOD FOR PREDICTING MACHINING QUALITY OF MACHINE TOOL. / Cheng, Fan-Tien (Inventor).
Patent No.: 9508042.Research output: Patent
TY - PAT
T1 - METHOD FOR PREDICTING MACHINING QUALITY OF MACHINE TOOL
AU - Cheng, Fan-Tien
PY - 2014/5/8
Y1 - 2014/5/8
N2 - A virtual metrology based method for predicting machining quality of a machine tool is provided. In this method, each product accuracy item is correlated with operation paths of the machine tool. During a modeling stage, the machine tool is operated to process workpiece samples, and sample sensing data of the workpiece samples associated with the operation paths are collected during the operation of the machine tool. The sample sensing data of each workpiece sample is de-noised and converted into the sample feature data corresponding to each feature type. The workpiece samples are measured with respect to the product accuracy item and integrated into the feature data for building a predictive model, thereby obtaining quality predicted data for each product accuracy item. During a usage stage, accuracy item values of a workpiece are predicted using the feature data during processing the workpiece in accordance with the predictive models.
AB - A virtual metrology based method for predicting machining quality of a machine tool is provided. In this method, each product accuracy item is correlated with operation paths of the machine tool. During a modeling stage, the machine tool is operated to process workpiece samples, and sample sensing data of the workpiece samples associated with the operation paths are collected during the operation of the machine tool. The sample sensing data of each workpiece sample is de-noised and converted into the sample feature data corresponding to each feature type. The workpiece samples are measured with respect to the product accuracy item and integrated into the feature data for building a predictive model, thereby obtaining quality predicted data for each product accuracy item. During a usage stage, accuracy item values of a workpiece are predicted using the feature data during processing the workpiece in accordance with the predictive models.
M3 - Patent
M1 - 9508042
ER -