Microstructure and microwave dielectric properties of Y(Nb _1-xTa _x)O ₆ (x = 0.020.1) ceramics

Microstructure and microwave dielectric properties of the Y(Nb _1-xTa _x)TiO ₆ (x = 0.020.01)ceramics were investigated. The microwave dielectric properties such as dielectric constants, Qf value, and τ _f were studied as a function of composition and sintering temperature. The substitution of Ta promotes the microwave dielectric properties. Investigations were made on the structure and microstructure of the X-ray diffraction and scanning electron microscopy. The microwave dielectric properties of pure YNbTiO ₆ ceramic showed εr ∼17.9, Q×f ∼51,600 GHz, and τ _f ∼-53 ppm/°C are reported by Joseph et al. We found that a small amount of Ta substitution was effectively increased of the microwave dielectric properties, when x increasing to 0.05, Y(Nb _0.95Ta _0.05)TiO ₆ possesses (εr ∼22.03, Q×f 103,600 GHz, and τ _f ∼55.90 ppm/°C). The materials reported in this paper are excellent in terms of dielectric properties and cost of production compared to commercially available high quality dielectric resonators.