Microstructures and surface step-induced antiphase boundaries in epitaxial ferroelectric Ba 0.6Sr 0.4TiO 3 thin film on MgO

J. C. Jiang, Y. Lin, C. L. Chen, C. W. Chu, E. I. Meletis

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58 Citations (Scopus)

Abstract

Ba 0.6Sr 0.4TiO 3 thin films were epitaxially grown on (001) MgO substrates using pulsed laser ablation. Cross-sectional and plan-view transmission electron microscopy have been employed to study the microstructures and the interface behavior of the as-grown thin films. The 110-nm-thick Ba 0.6Sr 0.4TiO 3 thin films have a flat surface and sharp interface. The entire thin film has a single-crystal cubic structure with an interface relationship of (001) Ba 0.6Sr 0.4TiO 3//(001) MgO and 〈100〉 Ba 0.6Sr 0.4TiO 3//〈100〉 MgO with respect to the substrate. The 6.4% lattice mismatch between Ba 0.6Sr 0.4TiO 3 and MgO was completely released at the interface by forming equally spaced misfit dislocations with a distance of ∼3.2 nm. High-resolution transmission electron microscopy investigation shows that the initial grown layer of the film is the TiO 2 monolayer. The growth models of "substrate surface-terrace induced defects" for perovskite on a rock-salt system have been developed to understand the as-grown features where the conservative and nonconservative antiphase boundaries can be formed.

Original languageEnglish
Pages (from-to)3188-3192
Number of pages5
JournalJournal of Applied Physics
Volume91
Issue number5
DOIs
Publication statusPublished - 2002 Feb 15

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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