Microwave-frequency loss and dispersion in ferroelectric Ba 0.3Sr 0.7 TiO 3 thin films

James C. Booth, Ichiro Takeuchi, Kao-Shuo Chang

Research output: Contribution to journalArticle

27 Citations (Scopus)

Abstract

We report on broadband microwave-frequency measurements of epitaxial ferroelectric Ba0.3 Sr0.7 TiO3 thin films that reveal systematic increases in the loss and dispersion as the frequency increases toward 40 GHz. Our analysis provides evidence that the origin of this increased loss and dispersion is the direct coupling of microwave energy into a broad distribution of damped soft-phonon modes. We believe that nanometer-sized polar regions in the thin films play a role in this process, resulting in lattice-dynamical loss mechanisms that extend several decades in frequency below the frequency of the soft mode in these thin-film materials.

Original languageEnglish
Article number082908
JournalApplied Physics Letters
Volume87
Issue number8
DOIs
Publication statusPublished - 2005 Aug 22

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microwave frequencies
thin films
frequency measurement
polar regions
broadband
microwaves
energy

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

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abstract = "We report on broadband microwave-frequency measurements of epitaxial ferroelectric Ba0.3 Sr0.7 TiO3 thin films that reveal systematic increases in the loss and dispersion as the frequency increases toward 40 GHz. Our analysis provides evidence that the origin of this increased loss and dispersion is the direct coupling of microwave energy into a broad distribution of damped soft-phonon modes. We believe that nanometer-sized polar regions in the thin films play a role in this process, resulting in lattice-dynamical loss mechanisms that extend several decades in frequency below the frequency of the soft mode in these thin-film materials.",
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Microwave-frequency loss and dispersion in ferroelectric Ba 0.3Sr 0.7 TiO 3 thin films. / Booth, James C.; Takeuchi, Ichiro; Chang, Kao-Shuo.

In: Applied Physics Letters, Vol. 87, No. 8, 082908, 22.08.2005.

Research output: Contribution to journalArticle

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AB - We report on broadband microwave-frequency measurements of epitaxial ferroelectric Ba0.3 Sr0.7 TiO3 thin films that reveal systematic increases in the loss and dispersion as the frequency increases toward 40 GHz. Our analysis provides evidence that the origin of this increased loss and dispersion is the direct coupling of microwave energy into a broad distribution of damped soft-phonon modes. We believe that nanometer-sized polar regions in the thin films play a role in this process, resulting in lattice-dynamical loss mechanisms that extend several decades in frequency below the frequency of the soft mode in these thin-film materials.

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