Modeling and analysis strategies for failure amplification method

Shuen-Lin Jeng, V. Roshan Joseph, C. F.Jeff Wu

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

The failure amplification method (FAMe) uses a special type of factor known as amplification factor to amplify the failure probability so as to maximize the information in the experiment. A general strategy for model building in FAMe is proposed by using generalized linear models (GLM). The best design settings for improving the process capability are determined through carefully selected GLMs and loss functions. Two real experiments for improving the quality of printed circuit boards are used to illustrate the proposed strategy.

Original languageEnglish
Pages (from-to)128-139
Number of pages12
JournalJournal of Quality Technology
Volume40
Issue number2
DOIs
Publication statusPublished - 2008 Jan 1

Fingerprint

Amplification
Printed circuit boards
Experiments
Modeling
Factors
Experiment
Generalized linear model
Process capability
Printed circuit board
Loss function

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Strategy and Management
  • Management Science and Operations Research
  • Industrial and Manufacturing Engineering

Cite this

Jeng, Shuen-Lin ; Joseph, V. Roshan ; Wu, C. F.Jeff. / Modeling and analysis strategies for failure amplification method. In: Journal of Quality Technology. 2008 ; Vol. 40, No. 2. pp. 128-139.
@article{588e047d17e04c51ae3a7466b78d931a,
title = "Modeling and analysis strategies for failure amplification method",
abstract = "The failure amplification method (FAMe) uses a special type of factor known as amplification factor to amplify the failure probability so as to maximize the information in the experiment. A general strategy for model building in FAMe is proposed by using generalized linear models (GLM). The best design settings for improving the process capability are determined through carefully selected GLMs and loss functions. Two real experiments for improving the quality of printed circuit boards are used to illustrate the proposed strategy.",
author = "Shuen-Lin Jeng and Joseph, {V. Roshan} and Wu, {C. F.Jeff}",
year = "2008",
month = "1",
day = "1",
doi = "10.1080/00224065.2008.11917720",
language = "English",
volume = "40",
pages = "128--139",
journal = "Journal of Quality Technology",
issn = "0022-4065",
publisher = "American Society for Quality",
number = "2",

}

Modeling and analysis strategies for failure amplification method. / Jeng, Shuen-Lin; Joseph, V. Roshan; Wu, C. F.Jeff.

In: Journal of Quality Technology, Vol. 40, No. 2, 01.01.2008, p. 128-139.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Modeling and analysis strategies for failure amplification method

AU - Jeng, Shuen-Lin

AU - Joseph, V. Roshan

AU - Wu, C. F.Jeff

PY - 2008/1/1

Y1 - 2008/1/1

N2 - The failure amplification method (FAMe) uses a special type of factor known as amplification factor to amplify the failure probability so as to maximize the information in the experiment. A general strategy for model building in FAMe is proposed by using generalized linear models (GLM). The best design settings for improving the process capability are determined through carefully selected GLMs and loss functions. Two real experiments for improving the quality of printed circuit boards are used to illustrate the proposed strategy.

AB - The failure amplification method (FAMe) uses a special type of factor known as amplification factor to amplify the failure probability so as to maximize the information in the experiment. A general strategy for model building in FAMe is proposed by using generalized linear models (GLM). The best design settings for improving the process capability are determined through carefully selected GLMs and loss functions. Two real experiments for improving the quality of printed circuit boards are used to illustrate the proposed strategy.

UR - http://www.scopus.com/inward/record.url?scp=41549153732&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=41549153732&partnerID=8YFLogxK

U2 - 10.1080/00224065.2008.11917720

DO - 10.1080/00224065.2008.11917720

M3 - Article

AN - SCOPUS:41549153732

VL - 40

SP - 128

EP - 139

JO - Journal of Quality Technology

JF - Journal of Quality Technology

SN - 0022-4065

IS - 2

ER -