Modeling the impact of junction angles in tunnel field-effect transistors

Kuo Hsing Kao, Anne S. Verhulst, William G. Vandenberghe, Bart Sorée, Guido Groeseneken, Kristin De Meyer

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Modeling the impact of junction angles in tunnel field-effect transistors'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy

Chemical Compounds