TY - GEN
T1 - Modified BER Test for SAR ADCs
AU - Li, Chia Chuan
AU - Chang, Soon Jyh
N1 - Funding Information:
ACKNOWLEDGMENT This work was supported in part by Ministry of Science and Technology in Taiwan under the grant 107-2218-E-006-028, and by Novatek Microelectronics Corp., Taiwan.
Publisher Copyright:
© 2020 IEEE.
PY - 2020/9
Y1 - 2020/9
N2 - This paper presents a new post-processing method to estimate the real bit error rate (BER) of successive approximation register (SAR) analog-to-digital converters (ADCs) based on the conventional test scheme. Conventional testing method acquires BER based on difference between two measured output codes, rather than between a measured output code and its corresponding ideal one. This makes the resulting BER have a wrong trend with increasing sampling speed of ADC. Therefore, this work analyzes the difference between these two cases and proposes a simple post-processing method to obtain a more realistic BER based on the conventional BER test scheme. The experimental results demonstrate the proposed method can effectively obtain the correct BER trend for a SAR ADC.
AB - This paper presents a new post-processing method to estimate the real bit error rate (BER) of successive approximation register (SAR) analog-to-digital converters (ADCs) based on the conventional test scheme. Conventional testing method acquires BER based on difference between two measured output codes, rather than between a measured output code and its corresponding ideal one. This makes the resulting BER have a wrong trend with increasing sampling speed of ADC. Therefore, this work analyzes the difference between these two cases and proposes a simple post-processing method to obtain a more realistic BER based on the conventional BER test scheme. The experimental results demonstrate the proposed method can effectively obtain the correct BER trend for a SAR ADC.
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U2 - 10.1109/ITC-Asia51099.2020.00029
DO - 10.1109/ITC-Asia51099.2020.00029
M3 - Conference contribution
AN - SCOPUS:85096358605
T3 - Proceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020
SP - 100
EP - 105
BT - Proceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 4th IEEE International Test Conference in Asia, ITC-Asia 2020
Y2 - 23 September 2020 through 25 September 2020
ER -