Modified BER Test for SAR ADCs

Chia Chuan Li, Soon Jyh Chang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a new post-processing method to estimate the real bit error rate (BER) of successive approximation register (SAR) analog-to-digital converters (ADCs) based on the conventional test scheme. Conventional testing method acquires BER based on difference between two measured output codes, rather than between a measured output code and its corresponding ideal one. This makes the resulting BER have a wrong trend with increasing sampling speed of ADC. Therefore, this work analyzes the difference between these two cases and proposes a simple post-processing method to obtain a more realistic BER based on the conventional BER test scheme. The experimental results demonstrate the proposed method can effectively obtain the correct BER trend for a SAR ADC.

Original languageEnglish
Title of host publicationProceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages100-105
Number of pages6
ISBN (Electronic)9781728189444
DOIs
Publication statusPublished - 2020 Sep
Event4th IEEE International Test Conference in Asia, ITC-Asia 2020 - Taipei, Taiwan
Duration: 2020 Sep 232020 Sep 25

Publication series

NameProceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020

Conference

Conference4th IEEE International Test Conference in Asia, ITC-Asia 2020
Country/TerritoryTaiwan
CityTaipei
Period20-09-2320-09-25

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Hardware and Architecture
  • Information Systems and Management
  • Safety, Risk, Reliability and Quality

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