Multi-functional full-field common path heterodyne interferometer for linear birefringence material measurements

Yu Tsan Jeng, Hung Wei Chih, Zheng Wei Lin, Yu Lung Lo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this study, we adopted common path heterodyne interferometer to measure the optical parameters of linear birefringence materials. The sample is a multiple-order quartz quarter-waveplate and six optical parameters including the principal axis, phase retardation, order, thickness and the refractive indices (ne and no of a waveplate are extracted by using the sequential measurements with two experimental setups. Furthermore, in order to promote the technique in the full-field measurement, we apply CCD (charge couple device) as a detector triggered by CFLD (Complex Programmable Logic Device). The full-field information can be calculated by measuring three frames of the CCD image sequentially. In this paper, we not only successfully obtain six optical parameters in a single point detection, but also the principal axis and phase retardation in a full-field measurement are achieved.

Original languageEnglish
Title of host publicationProceedings of the 2005 IEEE International Conference on Mechatronics, ICM '05
Pages288-294
Number of pages7
DOIs
Publication statusPublished - 2005 Dec 1
Event2005 IEEE International Conference on Mechatronics, ICM '05 - Taipei, Taiwan
Duration: 2005 Jul 102005 Jul 12

Publication series

NameProceedings of the 2005 IEEE International Conference on Mechatronics, ICM '05
Volume2005

Other

Other2005 IEEE International Conference on Mechatronics, ICM '05
CountryTaiwan
CityTaipei
Period05-07-1005-07-12

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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    Jeng, Y. T., Chih, H. W., Lin, Z. W., & Lo, Y. L. (2005). Multi-functional full-field common path heterodyne interferometer for linear birefringence material measurements. In Proceedings of the 2005 IEEE International Conference on Mechatronics, ICM '05 (pp. 288-294). [1529271] (Proceedings of the 2005 IEEE International Conference on Mechatronics, ICM '05; Vol. 2005). https://doi.org/10.1109/ICMECH.2005.1529271