In this study, we adopted common path heterodyne interferometer to measure the optical parameters of linear birefringence materials. The sample is a multiple-order quartz quarter-waveplate and six optical parameters including the principal axis, phase retardation, order, thickness and the refractive indices (ne and no of a waveplate are extracted by using the sequential measurements with two experimental setups. Furthermore, in order to promote the technique in the full-field measurement, we apply CCD (charge couple device) as a detector triggered by CFLD (Complex Programmable Logic Device). The full-field information can be calculated by measuring three frames of the CCD image sequentially. In this paper, we not only successfully obtain six optical parameters in a single point detection, but also the principal axis and phase retardation in a full-field measurement are achieved.