TY - GEN
T1 - Multi-layer Permittivity Measurement Based on Complementary Split-Ring Resonator and Neural Networks
AU - Yu, Chung En
AU - Yang, Chin Lung
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/8/26
Y1 - 2020/8/26
N2 - A neural network-based method for multi-layer permittivity measurement is proposed in this paper. This method uses the multiple-square concentric complementary split-ring resonator (CSRR) to take multiple non-identical resonance frequency measurement, and a scalable, iterative neural network approach is applied to estimate for dielectric property measurement. Instead of the tedious development and establishment of analytic formulas, neural network engine solver can simplify this step and still have acceptable accuracy. The dual-layer MUTs measurement had an average error of 8.78% for ?1 and an average error of 8.9% for ?2. It can be extended to the measurement of more than two layers substrate.
AB - A neural network-based method for multi-layer permittivity measurement is proposed in this paper. This method uses the multiple-square concentric complementary split-ring resonator (CSRR) to take multiple non-identical resonance frequency measurement, and a scalable, iterative neural network approach is applied to estimate for dielectric property measurement. Instead of the tedious development and establishment of analytic formulas, neural network engine solver can simplify this step and still have acceptable accuracy. The dual-layer MUTs measurement had an average error of 8.78% for ?1 and an average error of 8.9% for ?2. It can be extended to the measurement of more than two layers substrate.
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U2 - 10.1109/iWEM49354.2020.9237451
DO - 10.1109/iWEM49354.2020.9237451
M3 - Conference contribution
AN - SCOPUS:85097344833
T3 - Proceedings - 2020 International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2020
BT - Proceedings - 2020 International Workshop on Electromagnetics
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2020 International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2020
Y2 - 26 August 2020 through 28 August 2020
ER -