Mura defect detection using discrete wavelet transform

Shang-Liang Chen, Shang Ta Chou

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)


Mura defects in LCM panel of TFT-LCD have the properties of local low contrast and luminance variation without a clear contour on a uniformly produced surface. This thesis proposes two methods which are discrete cosine transform (DCT) and discrete wavelet transform (DWT). These methods successfully detect simulated blob-mura and real mura defects. DWT method is based on symmetrical 9/7 tap Daubechies coefficients that is superior for filtering the regular structure of color filter and small area defects. DCT method is better for detecting luminance variation in large area and poor for small ones.

Original languageEnglish
Pages (from-to)75-80
Number of pages6
JournalJournal of the Chinese Society of Mechanical Engineers, Transactions of the Chinese Institute of Engineers, Series C/Chung-Kuo Chi Hsueh Kung Ch'eng Hsuebo Pao
Issue number1
Publication statusPublished - 2009 Feb 1

All Science Journal Classification (ASJC) codes

  • Mechanical Engineering


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