Nanoprobe measurements of materials at megabar pressures

Lin Wang, Yang Ding, Wenge Yang, Wenjun Liu, Zhonghou Cai, Jennifer Kung, Jinfu Shu, Russell J. Hemley, Wendy L. Mao, Ho Kwang Mao

Research output: Contribution to journalArticlepeer-review

34 Citations (Scopus)


The use of nanoscale x-ray probes overcomes several key limitations in the study of materials up to multimegabar (>200) pressures, namely, the spatial resolution of measurements of multiple samples, stress gradients, and crystal domains in micron to submicron size samples in diamond-anvil cells. Mixtures of Fe, Pt, and W were studied up to 282 GPa with 250-600 nm size synchrotron x-ray absorption and diffraction probes. The probes readily resolve signals from individual materials, between sample and gasket, and peak pressures, in contrast to the 5-ìm-sized x-ray beams that are now becoming routine. The use of nanoscale x-ray beams also enables single-crystal x-ray diffraction studies in nominally polycrystalline samples at ultrahigh pressures, as demonstrated in measurements of (Mg,Fe) SiO3 postperovskite. These capabilities have potential for driving a push toward higher maximum pressures and further miniaturization of high-pressure devices, in the process advancing studies at extreme conditions.

Original languageEnglish
Pages (from-to)6140-6145
Number of pages6
JournalProceedings of the National Academy of Sciences of the United States of America
Issue number14
Publication statusPublished - 2010 Apr 6

All Science Journal Classification (ASJC) codes

  • General

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