| Original language | English |
|---|---|
| Title of host publication | 11th VLSI Design/CAD Symposium |
| Place of Publication | Pingtung |
| Publication status | Published - 2000 Aug |
Neighborhood pattern-sensitive fault testing for semiconductor memories
Cheng-Wen Wu, K.-L. Cheng
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution