TY - GEN
T1 - New heterodyne scheme using an electro-optic modulator for birefringence measurements
AU - Lo, Yu-Lung
AU - Hsu, Ping Feng
PY - 2002/12/1
Y1 - 2002/12/1
N2 - A new method for measuring changes in birefringence (or retardation) by modulating an electro-optic (EO) modulator in a sine-wave signal is developed in a common-path interferometer (polarimeter). The standard heterodyne signal, therefore, could be formed with a new heterodyne scheme, and subsequently the phase shift regarding to changes in birefringence is demodulated by a lock-in amplifier or phase meter. As compared to the conventional techniques, this technique supplies an easier setup, wider modulated frequency and, therefore, a wider frequency response in a sensing system. Finally, the birefringence measurement based on an EO modulator and a new heterodyne scheme in a common-path interferometer is first demonstrated.
AB - A new method for measuring changes in birefringence (or retardation) by modulating an electro-optic (EO) modulator in a sine-wave signal is developed in a common-path interferometer (polarimeter). The standard heterodyne signal, therefore, could be formed with a new heterodyne scheme, and subsequently the phase shift regarding to changes in birefringence is demodulated by a lock-in amplifier or phase meter. As compared to the conventional techniques, this technique supplies an easier setup, wider modulated frequency and, therefore, a wider frequency response in a sensing system. Finally, the birefringence measurement based on an EO modulator and a new heterodyne scheme in a common-path interferometer is first demonstrated.
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M3 - Conference contribution
AN - SCOPUS:0141545081
SN - 7560317685
T3 - Proceedings of the Second International Symposium on Instrumentation Science and Technology
BT - Proceedings of the Second International Symposium on Instrumentation Science and Technology
A2 - Jiubin, T.
A2 - Xianfang, W.
A2 - Jiubin, T.
A2 - Xianfang, W.
T2 - Proceedings of the second International Symposium on Instrumentation Science and Technology
Y2 - 18 August 2002 through 22 August 2002
ER -