Abstract
The authors report an improved approach to modelling the I-V characteristics of a multipeak resonant tunnelling diode (RTD). The merit of this new RTD model is demonstrated.
Original language | English |
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Pages (from-to) | 1012-1013 |
Number of pages | 2 |
Journal | Electronics Letters |
Volume | 30 |
Issue number | 12 |
DOIs | |
Publication status | Published - 1994 Jun 9 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering