Nitride-based MSM UV photodetectors with photo-chemical annealing Schottky contacts

Y. K. Su, P. C. Chang, C. H. Chen, S. J. Chang, C. L. Yu, C. T. Lee, H. Y. Lee, J. Gong, P. C. Chen, C. H. Wang

Research output: Contribution to journalArticlepeer-review

23 Citations (Scopus)

Abstract

The undoped GaN (u-GaN) and two-dimensional electron gas (2DEG) metal-semiconductor-metal (MSM) photodetectors with semi-transparent Ni/Au Schottky barrier contact electrodes were fabricated. It was found that we could achieve a larger Ni/Au transmittance, higher Schottky barrier heights and larger photocurrent to dark current contrast ratios by photo-chemical annealing of these photodetectors in O2. It was also found that the maximum quantum efficiencies were 13% and 57% for the photo-chemical annealing u-GaN and 2DEG photodetectors, respectively. Furthermore, it was found that we could achieve a larger responsivity, a lower noise level and a larger detectivity by using the 2DEG structure.

Original languageEnglish
Pages (from-to)459-463
Number of pages5
JournalSolid-State Electronics
Volume49
Issue number3
DOIs
Publication statusPublished - 2005 Mar

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Materials Chemistry
  • Electrical and Electronic Engineering

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