Noise properties of ZnO nanowalls deposited using rapid thermal evaporation technology

T. P. Chen, F. Y. Hung, S. P. Chang, S. J. Chang, S. L. Wu, Z. S. Hu

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)


ZnO nanowalls are rapidly grown on a glass substrate using a low-temperature thermal evaporation method, without the use of a catalyst and the pre-deposition of a ZnO seed layer on the substrate. Most of the ZnO nanowalls are grown vertically and are about 70-200-nm thick and 2-μm long. The room-temperature photoluminescence spectra show a strong intrinsic ultraviolet (UV) emission and a weak defectrelated orange emission. The ZnO nanowall UV sensor is highly sensitive to UV light, with an excellent UV-to-visible ratio and good flicker noise characteristics. This shows the strong potential of ZnO nanowalls for use in UV sensors. At an applied bias of 2 V, the noise equivalent power and the normalized detectivity of the ZnO nanowall UV sensor are 1.87 × 10-10 W and 3.38 × 10 9 cm·Hz0.5·W-1, respectively..

Original languageEnglish
Article number6384664
Pages (from-to)213-216
Number of pages4
JournalIEEE Photonics Technology Letters
Issue number3
Publication statusPublished - 2013

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering


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