Non-contact monitoring of Ge and B diffusion in B-doped epitaxial Si 1-xGex bi-layers on silicon substrates during rapid thermal annealing by multiwavelength Raman spectroscopy

Min Hao Hong, Chun Wei Chang, Dung-Ching Perng, Kuan Ching Lee, Shiu Ko Jang Jian, Wei Fan Lee, Yen Chuang, Yu Ta Fan, Woo Sik Yoo

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B-doped, thin Si1-xGex bi-layers with different Ge content and B concentrations were epitaxially grown on Si(100) device wafers. Diffusion behavior of Ge and B atoms during rapid thermal annealing were monitored by multiwavelength micro-Raman spectroscopy. Raman spectra indicating possible Ge and B redistribution by thermal diffusion was observed from B-doped, thin Si1-xGex bi-layers on Si(100) wafers after rapid thermal annealing at 950°C or higher. Significant Ge and B diffusion in Si1-xGex bi-layers and Si substrates was verified by secondary ion mass spectroscopy. Pile up of B atoms at the surface and at the boundary between Si1-xGex bi-layers was observed in the early stages of thermal diffusion.

Original languageEnglish
Article number032150
JournalAIP Advances
Issue number3
Publication statusPublished - 2012 Dec 1


All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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