Abstract
一種非接觸式平面微波量測元件包含一基板、二饋入端以及一導線。基板具有相對設置之一第一表面及一第二表面。二饋入端分別設置於基板之二端。導線設置於第一表面上並電性連接該等饋入端。第二表面具有三諧振元件，該等諧振元件之該等諧振電流長度係不等長。
| Original language | English |
|---|---|
| Patent number | I603079 |
| Publication status | Published - 1800 |
Cite this
Yang, C-L. (1800). NON-CONTACT PLANAR MICROWAVE MEASURING DEVICE AND MEASURING METHOD THEREOF. (Patent No. I603079).
@misc{057ddda6acc343f8866341c4e632a97c,
title = "NON-CONTACT PLANAR MICROWAVE MEASURING DEVICE AND MEASURING METHOD THEREOF",
abstract = "一種非接觸式平面微波量測元件包含一基板、二饋入端以及一導線。基板具有相對設置之一第一表面及一第二表面。二饋入端分別設置於基板之二端。導線設置於第一表面上並電性連接該等饋入端。第二表面具有三諧振元件，該等諧振元件之該等諧振電流長度係不等長。",
author = "Chin-Lung Yang",
year = "1800",
language = "English",
type = "Patent",
note = "I603079",
}
Yang, C-L 1800, NON-CONTACT PLANAR MICROWAVE MEASURING DEVICE AND MEASURING METHOD THEREOF, Patent No. I603079.
NON-CONTACT PLANAR MICROWAVE MEASURING DEVICE AND MEASURING METHOD THEREOF. / Yang, Chin-Lung (Inventor).
Patent No.: I603079.Research output: Patent
TY - PAT
T1 - NON-CONTACT PLANAR MICROWAVE MEASURING DEVICE AND MEASURING METHOD THEREOF
AU - Yang, Chin-Lung
PY - 1800
Y1 - 1800
N2 - 一種非接觸式平面微波量測元件包含一基板、二饋入端以及一導線。基板具有相對設置之一第一表面及一第二表面。二饋入端分別設置於基板之二端。導線設置於第一表面上並電性連接該等饋入端。第二表面具有三諧振元件，該等諧振元件之該等諧振電流長度係不等長。
AB - 一種非接觸式平面微波量測元件包含一基板、二饋入端以及一導線。基板具有相對設置之一第一表面及一第二表面。二饋入端分別設置於基板之二端。導線設置於第一表面上並電性連接該等饋入端。第二表面具有三諧振元件，該等諧振元件之該等諧振電流長度係不等長。
M3 - Patent
M1 - I603079
ER -
Yang C-L, inventor. NON-CONTACT PLANAR MICROWAVE MEASURING DEVICE AND MEASURING METHOD THEREOF. I603079. 1800.